Design and Simulation of Logic Circuits at Nano Scale Beyond 32 Nano Meters (FinFet)

Authors

  • Muneer Ahmad Dar M. Tech. Research Scholar, Department of Electrical Engineering, RIMT University Gobindgarh, Punjab, India Author

Keywords:

CMOS, Logic Circuits, FinFet, Short Channel Effect, VLSI

Abstract

With advancement in electronic circuitry,  efforts are made to minimize chip size and to attain the  desired performance so on changing one parameter the  other parameters are effected like variables of field effect  transistor like length and width are key variables available  to the circuit designer to optimize circuit performance  .When in FET’s like CMOS (complementary metal oxide  semiconductor) the dimensions are decreased, the short  channel effect arises and creates a problem of concern.  With this effect an exponential increase in the leakage  current happens. In order to reduce the SCE and hence  leakage current, a new technology came into being in  recent years in which a 3D multiple gate CMOS like FinFet  (Fin Field Effect Transistor) has been developed which  possess advantages over conventional FET’s and has  attracted many engineers and designers to make it more  sophisticated. This technology works in the nano meter  range to minimize short channel effects. Many companies  like Intel, advanced micro device, global foundries have  started using FinFet technology. I have carried out my  work on the basis of current researches on FinFet  technology and how FinFet technology can be used in  future to design new logic and memory devices like  Inverter, MUX etc. Various  parameters of FinFet like reduced short channel effects,  less leakage current, low power consumption, less  propagation delay and less time delay are discussed.  Various mathematical models and software were used to  simulate power, delay, power delay product, average  power dissipation and energy delay products, this  technology was designed to  eliminate the problem of SCE by permitting transistors to  be scaled down into sub 20nm range. Use of PMT model  to design different logic devices at 16nm technology and  analyzed output of each circuit. Parameters like Power  dissipation, time delay and PDP were compared between  MOSFET (CMOS) technology and FinFet technology for  each circuit.  

Downloads

Download data is not yet available.

References

Himani Singh Rana, Himanshu Sirohia, “FINFET Technology-an Improvement in VLSI technology,” Journal of Current Science, Vol. 20, April, 2019.

M. Vamsi Prasad, K. Naresh Kumar, “Low Power FinFET Based Full Adder Design,” International Journal of Advanced Research in Computer and Communication Engineering, Vol. 6, Aug. 8, 2017.

Dr. Rajesh A Thaker. ECE. “Contemporary Research in FinFET Technology.” VGEC, Chandkheda, Ahmedabad, jan. 2015

Aqilah binti Abdul Tahrim, Huei Chaeng Chin, Cheng Siong Lim et al. “Design and Performance Analysis of 1-Bit FinFet Full Adder Cells for Subthreshold Region at 16nm process Technology,” journal of Nanomaterials, Hindawi Publishing Corporation, March 5, 2015.

Debajit Bhattacharya and Niraj K. Jha, “FinFETs: From Devices to Architectures,” Hindawi Publishing Corporation. Sep. 7, 20.14.

Sneha Arora et al., “A Noise Tolerant and Low Power Dynamic Logic Circuit Using Finfet Technology,” Journal of Engineering Research and Applications, Vol. 5, pp. 51- 56, 12, Dec.2015.

Harshita Gehlot, Mohd Ejaz Aslam Lodhi, “Analysis of Proposed FinFET Based Full Adder using CMOS Logic Style, “International Research Journal of Engineering and Technology (IRJET), Volume: 06, Apr. 2019.

Harshita Gehlot and Mohd Ejaz Aslam Lodhi., “Analysis of Proposed FinFET Based Full Adder using CMOS Logic Style”, vol: 06 Issue: 04, Apr 2019.

Bibin Lawrence R JencyRubia J, “Review of Fin FET Technology and Circuit Design Challenges,” Journal of Engineering Research and Applications, Vol. 5, pp.77-80, 12, Dec. 2015.

Mr. M. Pavan Kumaret al., “Efficient full adder using FinFET Technology,” International journal of Management, Technology and Engineering, Department of ECE, vol. 9, march, 2019.

Jagannath Samanta, Bishnu Prasad De et al., “Comparative study for delay & power dissipation of CMOS Inverter in UDSM range,” International Journal of Soft Computing and

Engineering (IJSCE) ISSN: 2231-2307, Volume-1, Issue-6, January 2012.

Hawkin Analysis and Performance Comparison of CMOS and FinFET for VLSI Applications S. Jim son Asst. Prof., ECE Muthayammal Engineering College, Rasipuram, Tamilnadu, India.

K. Roy, S.Mukhopadhyay, and H.Mahmoodi-Meimand, “Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits,” Proceedings of the IEEE,vol. 91, no. 2, pp. 305–327, 2003.

D. J. Frank, et al., "Device scaling limits of Si MOSFETs and their application dependencies," Proceedings of the IEEE, vol. 89, pp. 259-288, 2001.

D. A. Neamen, “The Semiconductor in Equilibrium, “Semiconductor Physics and Devices, McGraw Hill, 2003. [16] https://en.wikipedia.org/wiki/adder (electronics). [17] B. Yu, L. Chang, S. Ahmed et al., “FinFET scaling to 10nm gate length,” in Proceedings of the IEEE International Devices Meeting (IEDM '02), pp. 251–254, San Francisco, Calif, USA,December 2002.

R. A. Thakker, C. Sathe et al., “A novel table-based approach for design of FinFET

circuits,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems”, vol. 28, no. 7, pp.1061– 1070, 2009.

Prasad M and Dr. U B Mahadevaswamy, “Comparative Study of MOSFET, CMOS and FINFET,” Grenze Scientific Society, 2017.

Shivani Sharma, Gaurav Soni, “Comparative analysis of FinFET based 1-bit full adder cell

implemented using different logic styles at 10, 22 and 32nm”, IOSR Journal of VLSI and Signal Processing, Volume 6, Issue 1, Jan.-Feb. 2016, pp. 26-35.

Sheenu Rana, Rajesh Mehra, “Optimized CMOS Design of Full Adder using 45nm Technology”, International Journal of Computer applications, Volume 142 – No.13, May 2016.

Downloads

Published

2023-10-28

How to Cite

Design and Simulation of Logic Circuits at Nano Scale Beyond 32 Nano Meters (FinFet) . (2023). International Journal of Innovative Research in Engineering & Management, 9(1), 31–39. Retrieved from https://acspublisher.com/journals/index.php/ijirem/article/view/11232