Screeing of wheat germplasms for resistance against spike blight disease caused by Exserohilum rostratum

Authors

  • Tulasi korra Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi-221005, Uttar Pradesh, India. https://orcid.org/0000-0003-2253-9552
  • Ram Chandra Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi-221005, Uttar Pradesh, India.
  • Thirunarayanan P Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi-221005, Uttar Pradesh, India. https://orcid.org/0000-0002-7673-0769

DOI:

https://doi.org/10.48165/jefa.2024.19.02.34

Keywords:

Wheat, Exserohilum rostratum, resistance, Disease screening, AUDPC

Abstract

 

The field experiment was conducted at the experimental farm of Institute of Agricultural Sciences, BHU and UAS, Dharwad during the cropping seasons (2018-2019 and 2020-2021). A total of 100 wheat varieties were screened for resistance against spike blight disease. The results showed highest area under disease progress curve (AUDPC) of 593.25 in the DW4. No resistant lines were observed at BHU location. At Dharwad, DW 17 recording lowest 270.38 AUDPC showed resistant reactions. The frequency distribution of genotypes based on disease reaction at BHU consisted of resistant (Nil), moderately resistant (32.6%), moderately susceptible (61.38%), and susceptible (5.94%). The distribution of genotypes based on disease reaction at Dharwad consisted of resistant (10.89%), moderately resistant (84.15%), and moderately susceptible (4.9%). However, genotypes with high levels of spike blight resistance should be developed in future wheat breeding programmes. 

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Author Biographies

  • Tulasi korra, Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi-221005, Uttar Pradesh, India.

    Mycology and Plant Pathology, Banaras Hindu university, Varanasi, India

     

  • Ram Chandra, Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi-221005, Uttar Pradesh, India.

    Head of Department, Mycology and Plant Pathology, Banaras Hindu University, Varanasi, 221005, India

     

  • Thirunarayanan P, Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi-221005, Uttar Pradesh, India.

    Research Scholar, Mycology and Plant Pathology, BHU, India

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Published

2024-07-02

Issue

Vol. 19 No. 2 (2024): Journals Journal of Eco-friendly Agriculture (July)

Section

Articles

How to Cite

korra, T., Chandra, R., & Perumal, T. (2024). Screeing of wheat germplasms for resistance against spike blight disease caused by Exserohilum rostratum. Journal of Eco-Friendly Agriculture, 19(2), 446–449. https://doi.org/10.48165/jefa.2024.19.02.34
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